For reasons not important to describe here, I want to use the acronym “CMF” to describe a new way of arranging electronic devices on our test boards.
I’ll try to keep this simple:
We have (electronic) boards that test devices. The boards can test more than 1 device at a time, assuming the device is “small” enough (in an electronic sense).
For larger devices, boards can be “ganged” together. In this configuration, we can still test multiple devices: for example, we can gang 2 boards together and test 4 devices.
In the standard model of “ganged” boards, all devices must span all ganged boards: for example, with 2 ganged boards and 4 devices, board 1 tests the lower half of all devices, and board 2 tests the upper half of all devices.
Now they want us to support a new arrangement model, and I’d like to use “CMF” as an acronym for it. In this new model, boards can still be ganged together, but devices don’t have to span all boards. So, in this model, with 2 ganged boards and 4 devices, the first board can test (all of) devices 1 and 2 and the second board can test (all of) devices 3 and 4.
What I have for “CMF” so far is “C______ Model Format.” I’m looking for a “C” word to complete the acronym that means something like separated or distributed or independent – or something else that would describe the differences between the models. Anyone have any ideas?
Or if anyone has a suggestion for the entire CMF acronym, that would be good, too.
Thanks a lot for the help,
J.
And now we have a reasonable meaning for the acronym.